• Inquiry(0)
  • JUN AN ELECTRONIC CO., LTD.
    JUN AN ELECTRONIC CO., LTD.
    • Inquiry ()
    • About Us
    • Products
      • Emtest
        • Automotive EMC Test Solutions ISO7637
        • ESD Generators
        • EMS Compact Generators
        • Voltage Surge Generators
        • Conducted LF/RF Immunity Testing
        • Telecom Surge Generators
        • Harmonics & Flicker
      • PPST
        • PACIFIC POWER SOURCE
          • AMX Series
          • ACX Series
          • ASX Series
          • AFX Series
          • MS Series
          • G Series
        • APS
          • AC & DC Loads
          • AC & AC Sources
          • APS Software
        • STS
          • Battery Element Testers
          • Model 1740 Test System
        • ZENONE
          • GI Series
          • GI -SI Series
          • GIS Series
          • GV Series
          • GTS Series
          • FVC Series
          • AL3000 Series
          • AL3000R Series
      • Weetech
        • Low Voltage Cable Test
        • High Voltage Cable Test
        • Backplane/Chassis Test
        • Functional Test
      • BONN
        • BSA Series
        • BLMA Series
        • BLWA Series
      • KAST
    • Hot Products
    • News
    • Contact Us
    • Site Map
    • 駿安電子
    > Products » Emtest » Coupling Networks for EMC Testing » Combined 3-phase coupling/decoupling networks for Burst and Surge testing up to 10kV

    Products

      • Automotive EMC Test Solutions ISO7637
      • ESD Generators
      • EMS Compact Generators
      • Voltage Surge Generators
      • Conducted LF/RF Immunity Testing
      • Telecom Surge Generators
      • Harmonics & Flicker
      • PACIFIC POWER SOURCE
        • AMX Series
        • ACX Series
        • ASX Series
        • AFX Series
        • MS Series
        • G Series
      • APS
        • AC & DC Loads
        • AC & AC Sources
        • APS Software
      • STS
        • Battery Element Testers
        • Model 1740 Test System
      • ZENONE
        • GI Series
        • GI -SI Series
        • GIS Series
        • GV Series
        • GTS Series
        • FVC Series
        • AL3000 Series
        • AL3000R Series
      • Low Voltage Cable Test
      • High Voltage Cable Test
      • Backplane/Chassis Test
      • Functional Test
      • BSA Series
      • BLMA Series
      • BLWA Series
    • Combined 3-phase coupling/decoupling networks for Burst and Surge testing up to 10kV CNI 503x-series

    Combined 3-phase coupling/decoupling networks for Burst and Surge testing up to 10kV

    Combined coupler for EFT/Burst and Surge
    Surge as per ANSI/IEEE C62.41 (models CNI 503Bx only, other couplers on request)
    LEDs indicate active mode and coupling
    Automatic selection of Surge impedance
    Fully remote controlled by EM TEST generators
    Meet requirements for 3x690VAC and 1,000VDC
    Model : CNI 503x-series
    • Combined 3-phase coupling/decoupling networks for Burst and Surge testing up to 10kV CNI 503x-series

    • Description
    • Specifications
    • Features
    • Applications
    Benefits
    The CNI 503x-series coupling/decoupling networks are built fully complying to the standard requirements of EN/IEC 61000-4-4 and EN/IEC 61000-4-5. Residual voltage levels are carefully considered as well as the value of the decoupling inductors in order to meet the requirements with regard to voltage drop at the rated current of each type of CDN. Apart from the coverage of the EN/IEC 61000-4-5 standard the CNI 503Bx series also fully complies with the surge test requirements outlined in ANSI/IEEE C62.41.

    Being fully controlled by the related generators couplings of the CNI 503x are set automatically as selected for the test (either by manual operation or via software). When performing surge tests the generators will automatically set the required source impedance depending on the standard and the coupling mode.

    For CNI 503 coupling networks for DC EUT-supply an optional TEST ON function with a contactor up to 1,500 VDC / >100 A capacity is available.
    ANSI/IEEE C62.41
    EN 61000-4-12
    EN 61000-4-4
    EN 61000-4-5
    EN 61000-6-1
    EN 61000-6-2
    EN 61543
    IEC 60601-1-2
    IEC 61000-4-12
    IEC 61000-4-4
    IEC 61000-4-5
    IEC 61008-1
    IEC 61009-1
    IEC 61326
    IEC 61850-3
    ITU-T K.20
    ITU-T K.21
    ITU-T K.45
    Combined coupler for EFT/Burst and Surge
    Surge as per ANSI/IEEE C62.41 (models CNI 503Bx only, other couplers on request)
    LEDs indicate active mode and coupling
    Automatic selection of Surge impedance
    Fully remote controlled by EM TEST generators
    Meet requirements for 3x690VAC and 1,000VDC
    The three-phase coupling/decoupling networks of the CNI 503x series are used to couple EFT/Burst pulses and Surge pulses on DC-lines or to three-phase (4-wire or 5-wire supply lines) mains supply systems for voltages up to 1,000VDC / 3x690VAC. This includes the more and more common testing of inverters used in the area of renewable energies (e.g. photovoltaic systems, wind power stations, electric cars).

    Within the range of EM TEST coupling/decoupling networks we offer different models for test voltages from 5kV up to 10kV with DUT currents of 16A, 32A, 63A and 100A (higher current ratings on request) for the various test requirements and equipment configuration.

    Related Products

    Coupling/decoupling network for unshielded symmetrical interconnection lines (communication lines)

    Coupling/decoupling network for unshielded symmetrical interconnection lines (communication lines)

    JUN AN ELECTRONIC CO., LTD.

    About Us  |  Products  |  Hot Products  |  News  |  Contact Us  |  Privacy Policy
    Tel:886-2-22120182          Fax:886-2-29237718
    Email:junan@jun-an.com.tw
    Address:7F., NO.57, SEC. 2, YONGHE RD., YONGHE DIST., NEW TAIPEI CITY 23444, TAIWAN (R.O.C.)

    © 2026 JUN AN ELECTRONIC CO., LTD. All rights reserved. Made in Taiwan 網路行銷

    This site uses cookies to collect the necessary user browsing behavior so that we can provide you with a better browsing experience. Browse this site, which means you agree with "online privacy declaration."
    × Close